| Full Name | Multimode Atomic Force Microscope |
|---|---|
| Category | Microscopy |
| Description | System allows for imaging, measuring and manipulating matter at the nanoscale level. There is a variable deflection mode useful for small, high speed atomic resolution scans as well as a lateral force mode which measures frictional forces on surfaces. Phase imaging mode can be used to differentiate areas on a sample with such differing properties as friction, adhesion and viscoelasticity. |
| Location | HSCI-276 |
| Contacts | Primary:
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| Cost of Operation | |
| Training Needed | Training is needed, please contact Dr. Thomas Gredig for specific training. |
| Manufacturer | Digital Instruments |